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Code:
smartctl -x /dev/disk1
smartctl 7.4 2023-08-01 r5530 [Darwin 17.7.0 x86_64] (sf-7.4-1)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: S1DBNSAD932303Z
LU WWN Device Id: 5 002538 8a000f0c6
Firmware Version: EXT0AB0Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Nov 21 13:53:11 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 099 099 010 - 9
9 Power_On_Hours -O--CK 088 088 000 - 59621
12 Power_Cycle_Count -O--CK 099 099 000 - 545
177 Wear_Leveling_Count PO--C- 001 001 000 - 1796
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 9
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 099 099 010 - 9
187 Uncorrectable_Error_Cnt -O--CK 099 099 000 - 87
190 Airflow_Temperature_Cel -O--CK 072 036 000 - 28
195 ECC_Error_Rate -O-RC- 199 199 000 - 87
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 238
241 Total_LBAs_Written -O--CK 099 099 000 - 380792777662
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
Read GP Log Directory failed
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x09 SL R/W 1 Selective self-test log
0x30 SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
No Errors Logged
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/286242
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (2)
Index Estimated Time Temperature Celsius
3 2023-11-20 16:40 ? -
... ..(124 skipped). .. -
0 2023-11-21 13:30 ? -
1 2023-11-21 13:40 28 *********
2 2023-11-21 13:50 28 *********
SMART WRITE LOG does not return COUNT and LBA_LOW register
SCT (Get) Error Recovery Control command failed
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
Read SATA Phy Event Counters failed