=== START OF INFORMATION SECTION ===
Model Family: Apple SD/SM/TS...E/F/G SSDs
Device Model: APPLE SSD SM0128G
Serial Number: S29BNY0HA00426
LU WWN Device Id: 5 002538 900000000
Firmware Version: BXW1SA0Q
User Capacity: 121,332,826,112 bytes [121 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Mar 25 22:32:54 2019 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x001a 200 200 000 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 000 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1273
12 Power_Cycle_Count 0x0032 093 093 000 Old_age Always - 6335
169 Unknown_Apple_Attrib 0x0013 244 244 010 Pre-fail Always - 863332467168
173 Wear_Leveling_Count 0x0032 192 192 100 Old_age Always - 171814879346
174 Host_Reads_MiB 0x0022 099 099 000 Old_age Always - 11795228
175 Host_Writes_MiB 0x0022 099 099 000 Old_age Always - 9824288
192 Power-Off_Retract_Count 0x0012 099 099 000 Old_age Always - 341
194 Temperature_Celsius 0x0022 065 021 000 Old_age Always - 35 (Min/Max 18/79)
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x001a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.