Und das ist der Smart Report
smartctl 6.5 2016-05-07 r4318 [Darwin 16.6.0 x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MK7559GSXF
Serial Number: 11AOT0PIT
LU WWN Device Id: 5 000039 301b81347
Firmware Version: GQ005B
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Jun 4 07:28:31 2017 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 195) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 2179
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 8452
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 068 068 000 Old_age Always - 12909
10 Spin_Retry_Count 0x0033 253 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4775
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 16826
192 Power-Off_Retract_Count 0x0032 095 095 000 Old_age Always - 2906
193 Load_Cycle_Count 0x0032 009 009 000 Old_age Always - 910942
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 32 (Min/Max 10/47)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 99
222 Loaded_Hours 0x0032 078 078 000 Old_age Always - 8807
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 287
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 975
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 11921 hours (496 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 b0 d4 e2 e1 Error: UNC 1 sectors at LBA = 0x01e2d4b0 = 31642800
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 b1 cf e2 e0 00 00:00:04.848 READ DMA EXT
25 00 00 b1 c7 e2 e0 00 00:00:04.834 READ DMA EXT
25 00 00 b1 bf e2 e0 00 00:00:04.824 READ DMA EXT
25 00 00 b1 b7 e2 e0 00 00:00:04.815 READ DMA EXT
25 00 00 b1 af e2 e0 00 00:00:04.804 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.