smartctl 6.1 2013-03-16 r3800 [x86_64-apple-darwin12.3.0] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HTS545050B9A302
Serial Number: 110507PBL400M7K9XDMV
LU WWN Device Id: 5 000cca 67beec87d
Firmware Version: PB4AC60Y
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Mon Oct 28 23:25:42 2013 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 158) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 137 137 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 095 095 000 Old_age Always - 9224
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 358
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 087 087 000 Old_age Always - 5755
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 7643
160 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 773094113280
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 8589934616
193 Load_Cycle_Count 0x0012 054 054 000 Old_age Always - 460530
194 Temperature_Celsius 0x0002 166 166 000 Old_age Always - 33 (Min/Max 7/44)
195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 387
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 2
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 142
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 5725 hours (238 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 36 4a 9a 4e 4a Error: UNC 54 sectors at LBA = 0x0a4e9a4a = 172923466
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 80 98 4e 40 00 02:04:29.100 READ DMA EXT
25 00 00 80 a8 4e 40 00 02:04:25.600 READ DMA EXT
25 00 00 80 a0 4e 40 00 02:04:18.900 READ DMA EXT
25 00 00 80 98 4e 40 00 02:04:12.300 READ DMA EXT
2f 00 01 10 00 00 00 00 02:04:12.200 READ LOG EXT
Error 13 occurred at disk power-on lifetime: 5725 hours (238 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 36 4a 9a 4e 4a Error: UNC 54 sectors at LBA = 0x0a4e9a4a = 172923466
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 80 98 4e 40 00 02:04:12.300 READ DMA EXT
2f 00 01 10 00 00 00 00 02:04:12.200 READ LOG EXT
60 00 e0 80 a8 4e 40 00 02:04:05.200 READ FPDMA QUEUED
60 00 d8 80 a0 4e 40 00 02:04:00.000 READ FPDMA QUEUED
60 00 d0 80 98 4e 40 00 02:03:57.300 READ FPDMA QUEUED
Error 12 occurred at disk power-on lifetime: 5723 hours (238 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 07 89 5e 09 4a Error: UNC 7 sectors at LBA = 0x0a095e89 = 168386185
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 88 5e 09 40 00 00:20:12.900 READ DMA EXT
2f 00 01 10 00 00 00 00 00:20:12.900 READ LOG EXT
60 20 d0 10 a0 f4 40 00 00:20:09.000 READ FPDMA QUEUED
60 08 c8 88 5e 09 40 00 00:20:08.900 READ FPDMA QUEUED
60 08 c0 58 f5 aa 40 00 00:20:08.900 READ FPDMA QUEUED
Error 11 occurred at disk power-on lifetime: 5684 hours (236 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 c8 38 dc 76 43 Error: UNC 200 sectors at LBA = 0x0376dc38 = 58121272
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 dc 76 40 00 00:14:34.900 READ DMA EXT
25 00 00 00 dc 76 40 00 00:14:31.000 READ DMA EXT
25 00 00 00 dc 76 40 00 00:14:27.000 READ DMA EXT
2f 00 01 10 00 00 00 00 00:14:27.000 READ LOG EXT
60 00 98 00 dc 76 40 00 00:14:23.000 READ FPDMA QUEUED
Error 10 occurred at disk power-on lifetime: 5684 hours (236 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 c8 38 dc 76 43 Error: UNC 200 sectors at LBA = 0x0376dc38 = 58121272
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 dc 76 40 00 00:14:31.000 READ DMA EXT
25 00 00 00 dc 76 40 00 00:14:27.000 READ DMA EXT
2f 00 01 10 00 00 00 00 00:14:27.000 READ LOG EXT
60 00 98 00 dc 76 40 00 00:14:23.000 READ FPDMA QUEUED
60 01 90 00 dc 76 40 00 00:14:22.900 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.